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18 December 2001 Application of new five-channel x-ray/EUV spectrometer with an imaging transmission diffraction grating for study of z-pinch plasma sources
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Abstract
A new five-channel spectrometer is designed for registration of x-ray spectral line emissions from plasmas with temporal resolution. All channels are independent from each other and include wide variety of dispersing elements (crystals and/or multiplayer mirrors) and detectors (Si-diodes or PCD). Sixth channel is used for device alignments with minimum adjustments can be used as channel for transmission diffraction grating spectrometer or channel for another time resolved detector. The device was used in experiments with different plasma sources in different configurations and showed its reliability and flexibility.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitry A. Fedin, Victor L. Kantsyrev, Bruno S. Bauer, Stephan Fuelling, Sean Keely, Hank LeBeau, Gene Newman, and Wade Cline "Application of new five-channel x-ray/EUV spectrometer with an imaging transmission diffraction grating for study of z-pinch plasma sources", Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); https://doi.org/10.1117/12.450765
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