19 December 2001 Mercuric iodide polycrystalline films
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Abstract
Mercuric iodide (HgI2) polycrystalline films are being developed as a new detector technology for digital x-ray imaging. Films have been grown with areas up to 80 cm2 (4' diameter) and thickness of 20-250 micrometers using sublimation. The growth techniques used can be easily extended to produce much larger film areas (>10'x10'). Thickness of the grown layers and size of the grains can be regulated over a wide range by adjusting the growth parameters. The films were characterized with respect to their electrical properties and in response to ionizing radiation. Leakage current as low as 40 pA/cm2 at the operating bias voltage of ~50 V has been observed. High sensitivity and excellent linearity in the response to x-rays was measured. Signals from these HgI2 polycrystalline detectors, in response to ionizing radiation, compare favorably to the best published results for all high Z polycrystalline films grown elsewhere, including TlBr, PbI2 and HgI2. The low dark current, good sensitivity, and linearity of the response to x-rays put HgI2 polycrystalline semiconductor detectors in position as a leading candidate material for use in digital x-ray imaging systems. Our future efforts will concentrate on optimization of film growth techniques specifically for deposition on a-Si:H flat panel readout arrays.
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Jan S. Iwanczyk, Bradley E. Patt, Carolyn R. Tull, Lawrence R. MacDonald, Nathan Skinner, Edward J. Hoffman, Laura Fornaro, Luis Mussio, Edgardo Saucedo, Alvaro Gancharov, "Mercuric iodide polycrystalline films", Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); doi: 10.1117/12.450793; https://doi.org/10.1117/12.450793
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