8 November 2001 Characteristics of neutron multilayer devices from ray-tracing calculations
Author Affiliations +
Abstract
Characteristics of a neutron focusing device based on five thin-film multilayers that are (1) oriented at slightly different angles with respect to the mean ray to converge the neutron beam reflected by each individual section, (2) have slightly different d-spacings such that the neutron beam reflected by each section has the same mean wavelength, were evaluated using a Monte Carlo program for a number of geometries. The influence of changing the distance between the focusing device and the detector was studied,and the effect of small deviations from the desired values was also explored.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anand M. Saxena, Anand M. Saxena, } "Characteristics of neutron multilayer devices from ray-tracing calculations", Proc. SPIE 4509, Neutron Optics, (8 November 2001); doi: 10.1117/12.448072; https://doi.org/10.1117/12.448072
PROCEEDINGS
13 PAGES


SHARE
Back to Top