8 August 2001 Analysis of factors affecting the accuracy of the measurement of resistance in a charge balancing circuit
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Proceedings Volume 4516, Optoelectronic and Electronic Sensors IV; (2001) https://doi.org/10.1117/12.435918
Event: Optoelectronic and Electronic Sensors IV, 2000, Gliwice, Poland
Abstract
This article presents results of a theoretical and simulating analysis of the accuracy of the method of the direct measurement of resistance using a charge balancing circuit and the 'autozero' method. Achieved results showed that those construction makes it possible to reduce a majority of factors that could be sources of measurement errors, however an extent of the reduction first of all depends on parameters of the used semiconductor switches. The influence of finite values of on-state resistances and switching times on a linearity and monotonicity of the conversion characteristic were analyzed in the paper. Results of simulations have been based on parameters of contemporary MOSFET transistors that can be used to switch currents in the circuit.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Gronczynski, J. Gronczynski, Janusz Mroczka, Janusz Mroczka, } "Analysis of factors affecting the accuracy of the measurement of resistance in a charge balancing circuit", Proc. SPIE 4516, Optoelectronic and Electronic Sensors IV, (8 August 2001); doi: 10.1117/12.435918; https://doi.org/10.1117/12.435918
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