Paper
12 July 2001 xdProf: a tool for the capture and analysis of stack traces in a distributed Java system
John Lambert, H. Andy Podgurski
Author Affiliations +
Proceedings Volume 4521, Java/Jini Technologies; (2001) https://doi.org/10.1117/12.432993
Event: ITCom 2001: International Symposium on the Convergence of IT and Communications, 2001, Denver, CO, United States
Abstract
We describe the design and implementation of xdProf: a tool that captures and analyzes stack traces sent at a fixed interval from Java Virtual Machines in a distributed system. The xdProf client uses the Java Virtual Machine Profiling Interface and works with any compliant implementation; no access to application source code is necessary, no library modifications are needed, and there is no run-time instrumentation of Java byte code. Configuration options given at virtual machine startup specify the interval for stack trace transmission and the remote xdProf server. The xdProf server collects information from multiple xdProf clients and provides an extensible interface for analysis. Current tools include a graphical user interface for viewing the most recent stack traces from multiple virtual machines and the generation of control flow graphs for each virtual machine. The performance impact of the xdProf client sending data over a local area network is minimal: less than a 8% increase in total elapsed time for a set of standard benchmarks. Future plans include real-time visualization, reliability estimation, trace capture, and performance analysis.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Lambert and H. Andy Podgurski "xdProf: a tool for the capture and analysis of stack traces in a distributed Java system", Proc. SPIE 4521, Java/Jini Technologies, (12 July 2001); https://doi.org/10.1117/12.432993
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Java

Sun

Profiling

Human-machine interfaces

Distributed computing

Visualization

Reliability

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