Surface scratch and pit analysis on optical interfaces

Waqar Mahmood; Murat Ozer; Elena Avram

doi:10.1117/12.436025

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30 July 2001 Surface scratch and pit analysis on optical interfaces

Waqar Mahmood; Murat Ozer; Elena Avram

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Proceedings Volume 4532, Active and Passive Optical Components for WDM Communication; (2001) https://doi.org/10.1117/12.436025
Event: ITCom 2001: International Symposium on the Convergence of IT and Communications, 2001, Denver, CO, United States

Abstract

It is shown that fiber surface performance degradation due to scratches and pits can be analyzed using wave scattering by imperfect surfaces. The return loss of a fiber endface/interface is obtained in terms of a parameter which gives the relative increase in scattering due to a defect over a defectless fiber endface. This parameter can be expressed as the ratio of the bidirectional scatter distribution functions with and without the defect. The predicted return losses as a function of the ratios mentioned above are presented.

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Waqar Mahmood, Murat Ozer, and Elena Avram "Surface scratch and pit analysis on optical interfaces", Proc. SPIE 4532, Active and Passive Optical Components for WDM Communication, (30 July 2001); https://doi.org/10.1117/12.436025