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30 July 2001 Surface scratch and pit analysis on optical interfaces
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Proceedings Volume 4532, Active and Passive Optical Components for WDM Communication; (2001) https://doi.org/10.1117/12.436025
Event: ITCom 2001: International Symposium on the Convergence of IT and Communications, 2001, Denver, CO, United States
Abstract
It is shown that fiber surface performance degradation due to scratches and pits can be analyzed using wave scattering by imperfect surfaces. The return loss of a fiber endface/interface is obtained in terms of a parameter which gives the relative increase in scattering due to a defect over a defectless fiber endface. This parameter can be expressed as the ratio of the bidirectional scatter distribution functions with and without the defect. The predicted return losses as a function of the ratios mentioned above are presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Waqar Mahmood, Murat Ozer, and Elena Avram "Surface scratch and pit analysis on optical interfaces", Proc. SPIE 4532, Active and Passive Optical Components for WDM Communication, (30 July 2001); https://doi.org/10.1117/12.436025
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