21 September 2001 Local window approach to detect line segment based on line model in low-quality image
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Proceedings Volume 4550, Image Extraction, Segmentation, and Recognition; (2001) https://doi.org/10.1117/12.441464
Event: Multispectral Image Processing and Pattern Recognition, 2001, Wuhan, China
Abstract
Finding line segments in an intensity image is one of the most fundamental issues in computer vision and other industry applications. Many methods have been presented, but robust line segment extraction is still a difficult and open problem. In this paper a local window method based on line-model to extract lineal features from low quality image is described. The method utilizes blob-coloring technique to extract potential line-blob in a local window area, then a line segment is discriminate using the line-model.
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Jian-zhen Gao, Jian-zhen Gao, Jingyu Yang, Jingyu Yang, Mingwu Ren, Mingwu Ren, Han Sun, Han Sun, } "Local window approach to detect line segment based on line model in low-quality image", Proc. SPIE 4550, Image Extraction, Segmentation, and Recognition, (21 September 2001); doi: 10.1117/12.441464; https://doi.org/10.1117/12.441464
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