18 September 2001 Principle of electro-optical system vulnerbility to ECM(EOSVECM)
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Proceedings Volume 4556, Data Mining and Applications; (2001) https://doi.org/10.1117/12.440296
Event: Multispectral Image Processing and Pattern Recognition, 2001, Wuhan, China
Abstract
This article qualitatively puts forward the uncertainty principle of electro-optical system vulnerability to ECM, a new objective function of EOSVECM, namely the turning point of dominance of utilizing electromagnetic spectrum is pointed out and analyzed, independent and divergent straight-line reasoning rule of dynamics principle used for evaluating EOSVECM quantitatively now, such as maximum- likelihood reasoning, is expanded into systemic and convergent mixed reasoning rule, such as aggregated transduction common-sense reasoning.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juquan Zhang, Yiyu Zhou, Lixin Zhu, Yingshu Yang, Ye Wu, Xiongbing Ye, "Principle of electro-optical system vulnerbility to ECM(EOSVECM)", Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); doi: 10.1117/12.440296; https://doi.org/10.1117/12.440296
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