18 September 2001 Principle of electro-optical system vulnerbility to ECM(EOSVECM)
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Proceedings Volume 4556, Data Mining and Applications; (2001) https://doi.org/10.1117/12.440296
Event: Multispectral Image Processing and Pattern Recognition, 2001, Wuhan, China
Abstract
This article qualitatively puts forward the uncertainty principle of electro-optical system vulnerability to ECM, a new objective function of EOSVECM, namely the turning point of dominance of utilizing electromagnetic spectrum is pointed out and analyzed, independent and divergent straight-line reasoning rule of dynamics principle used for evaluating EOSVECM quantitatively now, such as maximum- likelihood reasoning, is expanded into systemic and convergent mixed reasoning rule, such as aggregated transduction common-sense reasoning.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juquan Zhang, Juquan Zhang, Yiyu Zhou, Yiyu Zhou, Lixin Zhu, Lixin Zhu, Yingshu Yang, Yingshu Yang, Ye Wu, Ye Wu, Xiongbing Ye, Xiongbing Ye, } "Principle of electro-optical system vulnerbility to ECM(EOSVECM)", Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); doi: 10.1117/12.440296; https://doi.org/10.1117/12.440296
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