2 October 2001 High-frequency raster pinch correction scanner for retinal scanning displays
Author Affiliations +
Proceedings Volume 4561, MOEMS and Miniaturized Systems II; (2001) https://doi.org/10.1117/12.443107
Event: Micromachining and Microfabrication, 2001, San Francisco, CA, United States
Abstract
High-resolution (i.e., large pixel-count) and high frame rate dynamic microdisplays can be implemented by scanning a photon beam in a raster format across the viewer's retina. A resonant horizontal scanner and a linearly driven vertical scanner can create a 2-D raster for video display. The combined motion of the two scanners form a sinusoidal raster in the vertical direction and cause non-uniform line spacing for the case of bidirectional scanning as if the forward and return half-period raster lines are pinched near the edge of the display screen. Raster pinch effect degrades the image quality, especially for multi-beam scanning systems. What is needed is a vertical scanner that creates a stairstep motion instead of linear motion. A third scanner can be added to the system to create an approximation to a staircase motion in the vertical axis and correct for the non-uniform raster spacing. The raster pinch scanner requirements, mechanical and magnetic designs with FEA analysis, and preliminary test results are discussed in this paper.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hakan Urey, Hakan Urey, Frank A. DeWitt, Frank A. DeWitt, Karlton D. Powell, Karlton D. Powell, Mircea M. Bayer, Mircea M. Bayer, } "High-frequency raster pinch correction scanner for retinal scanning displays", Proc. SPIE 4561, MOEMS and Miniaturized Systems II, (2 October 2001); doi: 10.1117/12.443107; https://doi.org/10.1117/12.443107
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

MEMS scanners for display and imaging applications
Proceedings of SPIE (October 25 2004)
Scanning micromirrors: an overview
Proceedings of SPIE (October 25 2004)
Two-axis micromirror scanner
Proceedings of SPIE (July 02 1999)
Optical scanners for high-resolution RSD systems
Proceedings of SPIE (August 05 2002)

Back to Top