Paper
4 October 2001 Noncontact sensing of electric potential using electroluminescence effects
DaeHwa Jeong, Ju-Hyeon Lee, Ick-June Yune, Sang-Hoon Chae, B. B. Bhattarai
Author Affiliations +
Proceedings Volume 4564, Optomechatronic Systems II; (2001) https://doi.org/10.1117/12.444103
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States
Abstract
A new voltage sensing method has been tried using a n electro-luminescence effect. Optical images of the electric potential of conductive planar patterns could be obtained by this method. The brightness of the sensor surface is proportional to the voltage that is applied to the pattern electrode and the image is captured. By processing the image, defective part of the pattern electrode can be identified. This method is contact-free so that it can be applied to what is covered by an insulator layer. Also, we propose a driving method of the sensor that enables measuring DC voltages. This method may be applied to what is covered by an insulator layer. Also, we propose a driving method of the sensor that enables measuring DC voltages. This method may be applied to inspect the fine conductive patterns in non-contacting way during the fabrication process of display devices such as thin film transistor liquid crystal display panels.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
DaeHwa Jeong, Ju-Hyeon Lee, Ick-June Yune, Sang-Hoon Chae, and B. B. Bhattarai "Noncontact sensing of electric potential using electroluminescence effects", Proc. SPIE 4564, Optomechatronic Systems II, (4 October 2001); https://doi.org/10.1117/12.444103
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KEYWORDS
Electroluminescence

Sensors

Electrodes

LCDs

Polishing

Information operations

Surface finishing

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