Endpoint-finding algorithm for structured light metrology of large objects in cluttered environments

Pierino G. Bonanni; Juan M. de Bedout

doi:10.1117/12.455241

11 February 2002 Endpoint-finding algorithm for structured light metrology of large objects in cluttered environments

Pierino G. Bonanni, Juan M. de Bedout

Proceedings Volume 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II; (2002) https://doi.org/10.1117/12.455241
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States

Abstract

Imaging of objects under linear structured-light illumination is commonly performed to ascertain location, dimensions, and morphology. The method is particularly attractive for prismatic objects distinguished by a single flat surface, because the processing algorithm can focus on purely linear features, and need only search for abrupt discontinuities in those features. In this paper, we consider a steel mill gantry crane application, wherein the targets to be localized are large steel slabs illuminated by laser line projectors, imaged from very close range to preserve spatial resolution. Conventional Radon transform- based methods for locating target edges yield highly ambiguous results, due to an abundance of image clutter coupled with the limited view of the overall object. This paper presents a modified Radon transform-based method for locating the target edges defined by the laser lines, and makes use of coarse a priori knowledge of the line pattern to resolve ambiguous edge points caused by neighboring clutter. A one-dimensional derivative of the Radon transform is used to improve the localization of short line segments. The algorithm is robust to the case in which the target object appears off axis and the clutter dominates the field of view.

Citation Download Citation

Pierino G. Bonanni and Juan M. de Bedout "Endpoint-finding algorithm for structured light metrology of large objects in cluttered environments", Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); https://doi.org/10.1117/12.455241

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