11 February 2002 High-density sampling technique using special projections of light variation patterns in three-dimensional shape identification
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Proceedings Volume 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II; (2002) https://doi.org/10.1117/12.455246
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States
Abstract
We have continued research on the three-dimensional shape measurement system, using spatial projections. This method is non-contact, non-invasive, and completes measurement in a short time. However, light diffusion influence on the measurable accuracy. In addition, if marking on the surface of target object, it will become difficult to perform exact measurement. And the sampling density is not fully high. We proposed methods using differentiation and light variation patterns to enhance accuracy of measurement, to eliminate the influence of marking on the surface of target object, and to increase the sampling density. Since our methods involve computational manipulation of the data obtained by the original system, it requires no additional equipment. It is a very practical and effective method.
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Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, Yoshiyuki Uchida, "High-density sampling technique using special projections of light variation patterns in three-dimensional shape identification", Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455246; https://doi.org/10.1117/12.455246
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