11 February 2002 Surface profile measurement of specular objects by grating projection method
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Proceedings Volume 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II; (2002) https://doi.org/10.1117/12.455240
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States
Abstract
This paper proposes a grating projection method to measure three-dimensional profile of specular objects. This method is principally available for any reflective objects without limitation of sizes. A deformed grating pattern is observed when the reference grating is projected onto a mirror-like surface of object. This deformed pattern reflected from the surface is captured with a CCE camera and analyzed to get three-dimensional profile of the specimen. Experimental results are shown with different samples.
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Masayuki Yamamoto, Masahito Tonooka, Toru Yoshizawa, "Surface profile measurement of specular objects by grating projection method", Proc. SPIE 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II, (11 February 2002); doi: 10.1117/12.455240; https://doi.org/10.1117/12.455240
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