Paper
19 October 2001 Efficient passivation and size control of Si nanograins with stable photoluminescence
Wei Yu, Huijing Du, She Qiang Li, Guangsheng Fu
Author Affiliations +
Proceedings Volume 4580, Optoelectronics, Materials, and Devices for Communications; (2001) https://doi.org/10.1117/12.444937
Event: Asia-Pacific Optical and Wireless Communications Conference and Exhibit, 2001, Beijing, China
Abstract
The Si-rich a-SiNx films are synthesized by pulsed laser ablation of silicon target under NH3 atmosphere. By using laser-induced crystallization technique, the fabrication of nc-Si embedded in the SiNx is also realized. The crystallinity and microstructure of the films after laser annealing are characterized by scanning electron microscopy and micro-Raman spectroscopy. Additionally, in order to investigate the role of the SiNx on protecting the nc-Si from the oxidation in the air, the energy diffraction X-ray spectrum is also carried out. By photoluminescence (PL) spectrum measurement, the PL peak blue shifting is observed at room temperature. The results suggest that nc-Si embedded in the silicon nitride could be effectively passivated and stable PL of nasnosilicon grains could be obtained.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Yu, Huijing Du, She Qiang Li, and Guangsheng Fu "Efficient passivation and size control of Si nanograins with stable photoluminescence", Proc. SPIE 4580, Optoelectronics, Materials, and Devices for Communications, (19 October 2001); https://doi.org/10.1117/12.444937
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KEYWORDS
Silicon

Crystals

Laser crystals

Luminescence

Laser energy

Scanning electron microscopy

Laser ablation

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