29 October 2001 Structural and thermal analysis of a new phase-change optical memory material: Ag-Sb-Te
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Proceedings Volume 4594, Design, Fabrication, and Characterization of Photonic Devices II; (2001) https://doi.org/10.1117/12.446584
Event: International Symposium on Photonics and Applications, 2001, Singapore, Singapore
Abstract
Phase change optical recording disks using have been found to demonstrate long thermal stability of the amorphous recording marks. The thermal analysis of Ag-Sb-Te material was studied using DTA and structural analysis of the material were studied by x-ray diffraction, SEM and TEM respectively. The films were studied for both the cases: before and after annealing and it was concluded that the alloy could be used as a phase change optical memory material.
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Yagya Deva Sharma, Yagya Deva Sharma, Chhavi Bhatnagar, Chhavi Bhatnagar, Promod K. Bhatnagar, Promod K. Bhatnagar, "Structural and thermal analysis of a new phase-change optical memory material: Ag-Sb-Te", Proc. SPIE 4594, Design, Fabrication, and Characterization of Photonic Devices II, (29 October 2001); doi: 10.1117/12.446584; https://doi.org/10.1117/12.446584
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