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29 October 2001 Variable aperture and dynamic scanning noise measurement system of photoelectric imaging device
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Proceedings Volume 4595, Photonic Systems and Applications; (2001) https://doi.org/10.1117/12.446618
Event: International Symposium on Photonics and Applications, 2001, Singapore, Singapore
Abstract
In this paper, the measurement and analysis of the second-generation image intensifier have been discussed in detail. On the base of analyzing on the noise measurement principle of the second-generation image intensifier, the variable aperture & dynamic scanning noise measurement technique has been put forward. By using photoelectric multiply-tube which is low noise and high gain as the low light detector, the variable aperture & dynamic scanning noise measurement system of the second-generation image intensifier has been developed. The design and the schematic diagram of this noise measurement system have been present. Based on the above, the SNR has been tested and analyzed with variable incidence illumination, variable aperture in fixed-point measurement and scanning measurement condition. The corresponding noise distribution curves have been drawn. At last the characteristics of this noise measurement system of the second-generation image intensifier have been given out. This noise measurement system has important meaning on the design, evaluating and manufacturing of new photoelectric imaging device.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lianfa Bai, Shaoyuan Sun, Rong Xu, and Baomin Zhang "Variable aperture and dynamic scanning noise measurement system of photoelectric imaging device", Proc. SPIE 4595, Photonic Systems and Applications, (29 October 2001); https://doi.org/10.1117/12.446618
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