Paper
30 October 2001 Surface profile measurement using a CD optical pickup head
Zhaowei Zhong, W. W. Tham
Author Affiliations +
Proceedings Volume 4596, Advanced Photonic Sensors and Applications II; (2001) https://doi.org/10.1117/12.447370
Event: International Symposium on Photonics and Applications, 2001, Singapore, Singapore
Abstract
Surface profile measurement using a CD optical pickup head was studied. A simple controller capable of driving the laser diode in the optical pickup head with a power control feature was developed. A simple setup with the optical probe was used for experiments of surface profile measurement. The relationship between the height change and the light intensity received by the photo detector was studied. Hill-shape-like curves were obtained and the relationship was verified experimentally.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaowei Zhong and W. W. Tham "Surface profile measurement using a CD optical pickup head", Proc. SPIE 4596, Advanced Photonic Sensors and Applications II, (30 October 2001); https://doi.org/10.1117/12.447370
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Cited by 3 scholarly publications.
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KEYWORDS
Head

Sensors

Beam splitters

Diffraction

Reflectivity

Semiconductor lasers

Light

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