Paper
15 October 2001 Measurement of the behaviors of optoelectron in the photosensitive material by the dielectric spectrum technology
Xiaowei Li, Xiaoyong Hu, Li Han, Lifang Dong, Wei Yu
Author Affiliations +
Proceedings Volume 4600, Advances in Microelectronic Device Technology; (2001) https://doi.org/10.1117/12.444660
Event: International Symposium on Optoelectonics and Microelectronics, 2001, Nanjing, China
Abstract
The behaviors of optoelectron have a very important effect on the quality of photosensitive material, especially on the formation of image. In this paper, the dielectric spectrum technology is used to measure the behaviors of optoelectron. The curves of the behaviors of optoelectron are obtained. Many properties of the behaviors of the optoelectron are gotten through the detailed analysis of the results of the measurement. The influences of the behaviors of the optoelectron on the formation of image are analyzed primarily. The results obtained in this paper are valuable to the overall comprehension of the photosensitive mechanism of the silver halide materials and the process of the formation of image.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaowei Li, Xiaoyong Hu, Li Han, Lifang Dong, and Wei Yu "Measurement of the behaviors of optoelectron in the photosensitive material by the dielectric spectrum technology", Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); https://doi.org/10.1117/12.444660
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