15 October 2001 Thermal time constants of VLSI circuits
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Proceedings Volume 4600, Advances in Microelectronic Device Technology; (2001) https://doi.org/10.1117/12.444669
Event: International Symposium on Optoelectonics and Microelectronics, 2001, Nanjing, China
Abstract
The aim of the paper is to present the estimation of thermal time constants of various substrates of integrated circuits. The investigation leads to unexpected results, which show that materials having good thermal conductivity are recognized as not so good in aspect of thermal dynamics. The theoretical procedure carried out step-by-step leads to unsteady state temperature computation and thermal time constants calculation. It can be helpful for determination whether a chip is able to overcome so big deal of energy dissipated in expected short period of time. The comparison of thermal time constants of substrates or heat sinks made of various materials is included.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrzej Kos, "Thermal time constants of VLSI circuits", Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); doi: 10.1117/12.444669; https://doi.org/10.1117/12.444669
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