Transmissive properties of Zr02/Si02 photonic band gap materials

Xiaodong He; Xingyuan Liu; Dali Liu; Rongjin Yu

doi:10.1117/12.444679

15 October 2001 Transmissive properties of Zr0₂/Si0₂ photonic band gap materials

Xiaodong He, Xingyuan Liu, Dali Liu, Rongjin Yu

Proceedings Volume 4600, Advances in Microelectronic Device Technology; (2001) https://doi.org/10.1117/12.444679
Event: International Symposium on Optoelectonics and Microelectronics, 2001, Nanjing, China

Abstract

We present results of transmittance measurements on periodic layers of ZrO₂/SiO₂ at optical frequencies. These one- dimensional photonic band gap materials exhibit transparency bands and a huge stop band at optical frequencies. A unique feature of these dielectric/dielectric photonic band gap (MM- PBG) materials is that the overall reflectance in the stop band may increase as more periods are deposited. The center frequency and width of the stop bands are adjustable and generally depend on the thickness of the layers and the number of ZrO₂/SiO₂ periods. These simple periodic structures have applications as microcavity reflector in microcavity lasers.

Citation Download Citation

Xiaodong He, Xingyuan Liu, Dali Liu, and Rongjin Yu "Transmissive properties of Zr0₂/Si0₂ photonic band gap materials", Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); https://doi.org/10.1117/12.444679

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