Paper
5 February 2002 Small optical device for measurement of surface roughness
Vladimir Ya. Mendeleev, Sergey N. Skovorod'ko, Vladimir N. Porotov, Konstantin Yu. Kim
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Proceedings Volume 4607, Selected Papers from Fifth International Conference on Correlation Optics; (2002) https://doi.org/10.1117/12.455193
Event: Fifth International Conference on Correlation Optics, 2001, Chernivsti, Ukraine
Abstract
The device based on the reflectometric method is intended to measure surface roughness parameter Ra by means of comparison of light power reflected from a measured rough surface and light power reflected from standard rough surfaces with known Ra. The light power is measured in the specular direction for the normal incidence. The range of measured Ra is 0.05 - 1.3 micrometers . The device was tested in factory conditions for measurement of surface roughness of a roller during grinding. Values of Ra measured with the device were compared with the values determined with a profilometer. Difference between values Ra measured with the both devices was no more than 10%.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir Ya. Mendeleev, Sergey N. Skovorod'ko, Vladimir N. Porotov, and Konstantin Yu. Kim "Small optical device for measurement of surface roughness", Proc. SPIE 4607, Selected Papers from Fifth International Conference on Correlation Optics, (5 February 2002); https://doi.org/10.1117/12.455193
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KEYWORDS
Radium

Surface roughness

Optical testing

Optical components

Profilometers

Sensors

Analog electronics

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