18 February 2002 Computer simulation of line profile and data processing in diffraction experiments
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Proceedings Volume 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2002) https://doi.org/10.1117/12.456273
Event: Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2001, St. Petersburg, Russian Federation
Abstract
Data processing of a line profile is one of the most important procedures in a diffraction experiment. The main problem is connected with the presence of K(alpha 1) and K(alpha 2) wave components in X-ray radiation that produces the principal errors while determining the angular position or width of a diffraction line. By using computer methods in data processing, it is possible to realize effectively the Rachinger method of separation of K(alpha 1) and K(alpha 2) components. In this paper, computer simulation of diffraction profiles was used to analyze the possibilities of the Rachinger method. A separation criterion based on searching true principal parameters, namely the distance and intensity interrelation between K(alpha 1) and K(alpha 2) components, was proposed. The separation method is incorporated into the data processing for a portable diffractometer developed by authors from Polytechnical Institute (UERJ).The data processing includes control of an experimental procedure for the case of macro and microstress measurements.
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Tatiana Gurova, Tatiana Gurova, Joel R. Teodosio, Joel R. Teodosio, Joaquim T. Assis, Joaquim T. Assis, Vladimir I. Monin, Vladimir I. Monin, Yuri F. Titovets, Yuri F. Titovets, "Computer simulation of line profile and data processing in diffraction experiments", Proc. SPIE 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (18 February 2002); doi: 10.1117/12.456273; https://doi.org/10.1117/12.456273
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