Paper
18 February 2002 Nernst-Ettingshausen effect in the hopping condition range: experiment and theory for Pb1-xSnxTe doped with In
Sergei A. Nemov, Yuri I. Ravich
Author Affiliations +
Proceedings Volume 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2002) https://doi.org/10.1117/12.456244
Event: Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2001, St. Petersburg, Russian Federation
Abstract
In this contribution we report on Nernst-Ettingshausen effect, electrical conductivity, thermoelectric power, and Hall effect in the temperature range from 77 to 400 K for solid solution (Pb0.78Sn0.22)Te with In dopant impurity. Nernst-Ettingshausen coefficient Q exhibits properties unusual for IV-VI materials. It has positive sign and decreases rapidly with an increasing temperature. A theoretical model, taking into account hopping conductivity along strongly localized electronic states of In impurity is suggested. The model gives a good agreement with experimental data.
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Sergei A. Nemov and Yuri I. Ravich "Nernst-Ettingshausen effect in the hopping condition range: experiment and theory for Pb1-xSnxTe doped with In", Proc. SPIE 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (18 February 2002); https://doi.org/10.1117/12.456244
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KEYWORDS
Solids

Semiconductors

Temperature metrology

Scattering

Data modeling

Indium

Lead

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