1 April 2002 Micromachining and material change characterization using femtosecond laser oscillators
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Proceedings Volume 4633, Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers; (2002) https://doi.org/10.1117/12.461370
Event: High-Power Lasers and Applications, 2002, San Jose, California, United States
Abstract
We use third harmonic generation (THG) microscopy to image waveguides and single-shot structural modifications produced in bulk glass using femtosecond laser pulses. THG microscopy reveals the internal structure of waveguides written with a femtosecond laser oscillator, and gives a three-dimensional view of the complicated morphology of the structural changes produced with single, above-threshold femtosecond pulses. We find that THG microscopy is as sensitive to refractive index change as differential interference contrast microscopy, while also offering the three-dimensional sectioning capabilities of a nonlinear microscopy technique. It is now possible to micromachine three-dimensional optical devices and to image these structures in three dimensions, all with a single femtosecond laser oscillator.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher B. Schaffer, Christopher B. Schaffer, Juerg Aus der Au, Juerg Aus der Au, Eric Mazur, Eric Mazur, Jeffrey A. Squier, Jeffrey A. Squier, } "Micromachining and material change characterization using femtosecond laser oscillators", Proc. SPIE 4633, Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers, (1 April 2002); doi: 10.1117/12.461370; https://doi.org/10.1117/12.461370
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