Graded-index profile analysis from M-line, DNS, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations

Stefano Pelli; Giancarlo C. Righini; Marcelo Barbalho Pereira; Flavio Horowitz

doi:10.1117/12.433249

18 June 2002 Graded-index profile analysis from M-line, optical polarimetry, and EDS measurements of glass waveguides produced by K⁺/Ag⁺ ion-exchange combinations

Stefano Pelli, Giancarlo C. Righini, Marcelo Barbalho Pereira, Flavio Horowitz

Author Affiliations +

Proceedings Volume 4640, Integrated Optics: Devices, Materials, and Technologies VI; (2002) https://doi.org/10.1117/12.433249
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States

Abstract

Direct near-surface (DNS) and m-line techniques for the measurement of surface refractive index of ion-exchanged waveguides are compared. Measurements are also compared to direct investigation of ion concentration profiles by energy dispersion spectroscopy (EDS). Good agreement is obtained for the Ag⁺, K⁺, and Ag⁺+K⁺ exchanged samples, but not for the K⁺+Ag⁺ sample. The index profile approximately follows in a linear proportion the concentration profile after a single Ag⁺-exchange, while this is not observed for all other samples involving K⁺-exchange. These results on ion-exchange and refractive-index profiles are discussed, towards a comprehensive and accurate characterization of graded-index waveguides.

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Stefano Pelli, Giancarlo C. Righini, Marcelo Barbalho Pereira, and Flavio Horowitz "Graded-index profile analysis from M-line, optical polarimetry, and EDS measurements of glass waveguides produced by K⁺/Ag⁺ ion-exchange combinations", Proc. SPIE 4640, Integrated Optics: Devices, Materials, and Technologies VI, (18 June 2002); https://doi.org/10.1117/12.433249

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