Paper
30 April 2002 Peculiarities of solid-phase silicon surface laser-induced damage in vacuum and in various gases
Alexander F. Banishev, Vladimir S. Golubev, Alexei Yu. Kremnev
Author Affiliations +
Proceedings Volume 4644, Seventh International Conference on Laser and Laser-Information Technologies; (2002) https://doi.org/10.1117/12.464127
Event: Seventh International Conference on Laser and Laser Information Technologies, 2001, Vladimir, Suzdal, Russian Federation
Abstract
In the paper the peculiarities of relief inhomogeneities formation on silicon surface were investigated at irradiation by submicrosecond laser pulses in various gases. It was shown that the development and relaxation time of these inhomogeneities poorly depends on a type of gas.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander F. Banishev, Vladimir S. Golubev, and Alexei Yu. Kremnev "Peculiarities of solid-phase silicon surface laser-induced damage in vacuum and in various gases", Proc. SPIE 4644, Seventh International Conference on Laser and Laser-Information Technologies, (30 April 2002); https://doi.org/10.1117/12.464127
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KEYWORDS
Silicon

Semiconductor lasers

Laser scattering

Gases

Laser beam diagnostics

Oxygen

Scattering

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