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5 April 2002 Erbium spectroscopy in photosensitive tin-doped silica glass
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Proceedings Volume 4645, Rare-Earth-Doped Materials and Devices VI; (2002) https://doi.org/10.1117/12.461661
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
There is considerable interest in Er-doped silica-based materials with photosensitive properties for lasing and photorefractive applications. Tin doping has been recently found to induce strong and stable photosensitivity in silica glass. In this work, Er co-doped Sn-doped silica samples are obtained by sol-gel method by hydrolysis and condensation of TEOS and tin dibutyl diacetate, Er(NO3)3, or Er(CH3COO)3 as dopant precursors. Samples with Er content ranging between 0.1 and 1 mol% are investigated. Sn doping (0.4 mol%) is employed to induce photorefractivity properties in the glassy host. Time resolved photoluminescence, optical absorption and refractive index measurements are carried out and analyzed as a function of the Er content. The specific effects of Er content and Sn doping on the rare earth emission efficiency and photosensitivity of the glass are discussed. In particular it is shown that the Er emission shows the typical features of Er doped sol gel silica and the strong photosensitivity induced by tin doping is not affected by rare earth ions.
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Norberto Chiodini, Alberto Paleari, Giorgio Spinolo, Gilberto Brambilla, Alessandro Chiasera, and Maurizio Ferrari "Erbium spectroscopy in photosensitive tin-doped silica glass", Proc. SPIE 4645, Rare-Earth-Doped Materials and Devices VI, (5 April 2002); https://doi.org/10.1117/12.461661
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