12 June 2002 Measurement of gain spectra, refractive index shift, and linewidth enhancement factor in Al-free 980-nm lasers with broadened waveguide
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Proceedings Volume 4646, Physics and Simulation of Optoelectronic Devices X; (2002) https://doi.org/10.1117/12.470534
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
Measurements of the optical gain, differential refractive index and linewidth enhancement factor ((alpha) parameter) in 980 nm InGaAs/InGaAsP broad area lasers diodes are presented. Two different experimental configurations for the measurement of the Amplified Spontaneous Emission spectra, both using a spatial filtering technique, are compared. A new procedure for extracting the modal index change in the case of low optical confinement factor laser structures is proposed. We present and discuss the influence of the experimental technique, and of the data processing on the extracted value of the gain and ß parameter as a function of injection level.
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Daniel Rodriguez, Daniel Rodriguez, Luis Borruel, Luis Borruel, Ignacio Esquivias, Ignacio Esquivias, Michel M. Krakowski, Michel M. Krakowski, Philippe Collot, Philippe Collot, } "Measurement of gain spectra, refractive index shift, and linewidth enhancement factor in Al-free 980-nm lasers with broadened waveguide", Proc. SPIE 4646, Physics and Simulation of Optoelectronic Devices X, (12 June 2002); doi: 10.1117/12.470534; https://doi.org/10.1117/12.470534
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