4 June 2002 Oxide VCSEL reliability qualification at Agilent Technologies
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Proceedings Volume 4649, Vertical-Cavity Surface-Emitting Lasers VI; (2002) https://doi.org/10.1117/12.469227
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
In the past two years, Agilent Technologies has had a unique opportunity to study the reliability of VCSELs from most major manufacturers. We report on our methodology for qualifying prospective VCSEL suppliers, and briefly discuss our findings. The expected use environment for VCSELs is covered, along with VCSEL reliability limitations with existing technology. Differences between maverick and wearout failures are discussed, and examples of each are shown; VCSEL failure analysis is also briefly touched on. Finally, recent challenges in using oxide VCSELs in non-hermetic packaging, and 10 Gb/s operation, are briefly covered.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert W. Herrick, Robert W. Herrick, } "Oxide VCSEL reliability qualification at Agilent Technologies", Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); doi: 10.1117/12.469227; https://doi.org/10.1117/12.469227
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