4 June 2002 VCSEL reliability research at Gore Photonics
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Proceedings Volume 4649, Vertical-Cavity Surface-Emitting Lasers VI; (2002) https://doi.org/10.1117/12.469226
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
Reliability of the oxide confined VCSEL used in the Gore nLIGHTENTM parallel optic interconnect is discussed. The Gore reliability program for oxide confined devices has been active for approximately five years. The excellent long term reliability results have been obtained through an approach centered upon fundamental reliability research. The details of the device lifetime measurements and projections are presented along with some specific examples of projects from our reliability research experiences.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ted D. Lowes, Ted D. Lowes, } "VCSEL reliability research at Gore Photonics", Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); doi: 10.1117/12.469226; https://doi.org/10.1117/12.469226
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