21 May 2002 Assessment of colossal magnetoresistive manganite thin films for infrared detector applications
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Proceedings Volume 4650, Photodetector Materials and Devices VII; (2002) https://doi.org/10.1117/12.467669
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
Recently there has been great interest in doped manganite thin films exhibiting colossal magnetoresistance (CMR), in particular for magnetic sensing applications. These perovskite oxides exhibit a metal-insulator transition at the Curie temperature which is accompanied by a large change of resistance as the material loses its ferromagnetic properties. Since this resistance change occurs over a relatively narrow temperature range it is accompanied by very large temperature coefficients of resistance in the region of the phase transition, making these materials ideal candidates for infrared detectors utilizing resistance bolometers. This paper reports measured physical and electrical properties, the latter including 1/f noise, of doped manganite thin film CMR material deposited by pulsed- laser deposition. The potential performance of CMR based resistance bolometer devices is reported.
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Paul P. Donohue, Rex Watton, Michael A. Todd, Mark G. Blamire, Moon-Ho Jo, "Assessment of colossal magnetoresistive manganite thin films for infrared detector applications", Proc. SPIE 4650, Photodetector Materials and Devices VII, (21 May 2002); doi: 10.1117/12.467669; https://doi.org/10.1117/12.467669
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