Two schemes for digital holographic microscopy are explored. The goal is to revisit the issues that have hindered holographic microscopy since its earlier days, and find ways to overcome these difficulties. The first scheme discussed is a full-field holographic method that takes advantages of the properties of charge-coupled-device detectors, namely their high spatial as well as temporal bandwidths. The second scheme is based ona scanning holographic technique, and is shown to offer a wide range of possibilities such as enhanced transverse resolution, extended depth of focus, or axial sectioning. Both schemes are described, and some of their attributes and relative merits are discussed.