Establishing links between single gold nanoparticles buried inside SiO2 thin film and 351-nm pulsed-laser damage morphology

Semyon Papernov; Ansgar W. Schmid; Amy L. Rigatti; Jim Howe

doi:10.1117/12.461710

9 April 2002 Establishing links between single gold nanoparticles buried inside SiO₂ thin film and 351-nm pulsed-laser damage morphology

Semyon Papernov, Ansgar W. Schmid, Amy L. Rigatti, Jim Howe

Author Affiliations +

Proceedings Volume 4679, Laser-Induced Damage in Optical Materials: 2001; (2002) https://doi.org/10.1117/12.461710
Event: Boulder Damage, 2001, Boulder, CO, United States

Abstract

A model SiO₂ thin film system with nanoscale absorbing defects (gold nanoparticles) is employed with the goal of unraveling the connection between the pulsed-laser-energy absorption process inside a single nanoscale defect and the resulting film damage morphology. For this purpose, gold nanoparticles are lodged at a well-defined depth inside a SiO₂ monolayer film. Particle sites, as well as damage craters generated at these locations after 351-nm pulsed- laser irradiation, are mapped by means of atomic force microscopy. The results of this mapping confirm mechanism of damage that involves initiation in the nanoscale defect followed by absorption spreading out to the surrounding matrix. At low laser fluences (below optically detected damage onset), the probability of damage crater formation and the amount of the material vaporized is, to within +/- 25% of the average value, almost independent of the particle size. Inhomogeneities in the particle environment are held responsible for variances in the laser-energy absorption process and, consequently, for the observed particle/damage crater correlation behavior. The nanoscale damage threshold is introduced as a laser fluence causing localized melting without significant vaporization.

Citation Download Citation

Semyon Papernov, Ansgar W. Schmid, Amy L. Rigatti, and Jim Howe "Establishing links between single gold nanoparticles buried inside SiO₂ thin film and 351-nm pulsed-laser damage morphology", Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); https://doi.org/10.1117/12.461710

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