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Determination of mechanical properties of superhard amorphous, nanocrystalline, and microcrystalline materials by laser-based surface acoustic waves
Measurement and simulation of the laser-based thermo-elastic excitation and propagation of acoustic pulses for thin film and MEMS inspection
In-situ x-ray reflectivity measurement of the interface roughness of tantalum pentoxide thin film during rf magnetron sputtering deposition
Subsurface detection and characterization of Hertzian cracks in advanced ceramic materials using optical coherence tomography
Output signal prediction of an open-ended waveguide probe when scanning elliptically shaped cracks in metals
Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests