Paper
1 August 2002 Angled grating high-power semiconductor lasers: simulation of beam characteristics under thermal effects
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Abstract
The angled grating laser has been successful in achieving high-power diffraction-limited beams. The laser cavity utilizes a grating inclined at an angle to the facet to filter out the filamented beams. As a result, all of the filamented beams except the primary beam will be transmitted through the grating. In this paper we present the cavity resonance equation, and study temperature sensitivity of this device.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew M. Sarangan "Angled grating high-power semiconductor lasers: simulation of beam characteristics under thermal effects", Proc. SPIE 4732, Photonic and Quantum Technologies for Aerospace Applications IV, (1 August 2002); https://doi.org/10.1117/12.477416
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KEYWORDS
Diffraction gratings

High power lasers

Semiconductor lasers

Fabry–Perot interferometers

Laser damage threshold

Wave propagation

Optical filters

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