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16 October 1984 Electro-Optical Terrain Reflectance Modeling: A Perspective
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Proceedings Volume 0475, Remote Sensing: Critical Review of Technology; (1984) https://doi.org/10.1117/12.966237
Event: 1984 Technical Symposium East, 1984, Arlington, United States
Abstract
Electro-optical terrain reflectance modeling is one of the components required in our overall capability to simulate remote sensing measurement systems as an aid to the sensor or information processing designer. Given that sensor fields of view may vary from a few centimeters to several meters and that measurement devices may be placed at varying heights above the terrain surface, modeling of complex combinations of terrain classes or media with respect to both vertical and horizontal scales may be required. This paper addresses the issue of combining modeling approaches for different classes of materials in the optical regime and recommends a more formal approach to the radiative characterization of media properties as well as the calculation of the bidirectional reflectance distribution functions.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J A Smith, K D Cooper, and Alan H Strahler "Electro-Optical Terrain Reflectance Modeling: A Perspective", Proc. SPIE 0475, Remote Sensing: Critical Review of Technology, (16 October 1984); https://doi.org/10.1117/12.966237
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