19 April 2002 Modeling optoelectronic devices for simulation by means of element stamps
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Proceedings Volume 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002; (2002) https://doi.org/10.1117/12.462806
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, 2002, Cannes-Mandelieu, France
Abstract
This paper describes an approach to the simulation of optoelectronic integrated circuits based on the development of so-called element stamps for the models of optoelectronic devices. Using stamps, lumped-constant device models can be easily integrated in s a simulator, and built-in models greatly reduce the computational effort required for simulation, as compared to user-provided models written in a Hardware Description Language. As an example, the derivation of the stamp representing a quantum-well laser is described in detail, and numerical simulation results are presented.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giorgio Casinovi, "Modeling optoelectronic devices for simulation by means of element stamps", Proc. SPIE 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, (19 April 2002); doi: 10.1117/12.462806; https://doi.org/10.1117/12.462806
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