19 April 2002 Modeling optoelectronic devices for simulation by means of element stamps
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Proceedings Volume 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002; (2002) https://doi.org/10.1117/12.462806
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, 2002, Cannes-Mandelieu, France
Abstract
This paper describes an approach to the simulation of optoelectronic integrated circuits based on the development of so-called element stamps for the models of optoelectronic devices. Using stamps, lumped-constant device models can be easily integrated in s a simulator, and built-in models greatly reduce the computational effort required for simulation, as compared to user-provided models written in a Hardware Description Language. As an example, the derivation of the stamp representing a quantum-well laser is described in detail, and numerical simulation results are presented.
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Giorgio Casinovi, Giorgio Casinovi, } "Modeling optoelectronic devices for simulation by means of element stamps", Proc. SPIE 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, (19 April 2002); doi: 10.1117/12.462806; https://doi.org/10.1117/12.462806
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