13 September 2002 Microscopic characterization of ablation craters produced by femtosecond laser pulses
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Proceedings Volume 4760, High-Power Laser Ablation IV; (2002) https://doi.org/10.1117/12.482062
Event: International Symposium on High-Power Laser Ablation 2002, 2002, Taos, New Mexico, United States
Abstract
The formation of well-defined craters is a general feature of laser ablation with ultrashort laser pulses, indicative of a sharp ablation threshold. Results of a microscopic characterization of ablation craters on semiconductors after irradiation with single intense ultrashort laser pulses are presented.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vassili Temnov, Vassili Temnov, Klaus Sokolowski-Tinten, Klaus Sokolowski-Tinten, Nikola Stojanovic, Nikola Stojanovic, Sergei I. Kudryashov, Sergei I. Kudryashov, Dietrich von der Linde, Dietrich von der Linde, Boris Kogan, Boris Kogan, Andreas Schlarb, Andreas Schlarb, Bastian Weyers, Bastian Weyers, Rolf Moeller, Rolf Moeller, Joerg Seekamp, Joerg Seekamp, Clivia Sotomayor-Torres, Clivia Sotomayor-Torres, } "Microscopic characterization of ablation craters produced by femtosecond laser pulses", Proc. SPIE 4760, High-Power Laser Ablation IV, (13 September 2002); doi: 10.1117/12.482062; https://doi.org/10.1117/12.482062
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