30 April 2002 Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors
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Proceedings Volume 4761, Second Conference on Photonics for Transportation; (2002) https://doi.org/10.1117/12.463477
Event: Second Conference on Photonics for Transportation, 2001, Sochy, Russian Federation
Abstract
This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.
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M. M. Gourary, S. G. Rusakov, S. L. Ulyanov, M. M. Zharov, B. J. Mulvaney, "Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors", Proc. SPIE 4761, Second Conference on Photonics for Transportation, (30 April 2002); doi: 10.1117/12.463477; https://doi.org/10.1117/12.463477
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