30 July 2002 Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens
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Proceedings Volume 4765, International Conference on X-ray and Neutron Capillary Optics; (2002) https://doi.org/10.1117/12.489739
Event: International Conference on X-ray and Neutron Capillary Optics, 2001, Zvenigorod, Russian Federation
Abstract
A new version of diffraction method for measuring the absolute values of intra-plane distances dhkl in crystals and epixtaxial films using Kumakhov's x-ray poly-capillary half-lenses was developed. An attachment attachment to general-purpose x-ray diffractometer MRD was develoepd to register diffractograms within the angle range between 0 ÷ 160° with error of Δhkl/d approximately 10-5. A method of precision dhkl measurement was verified using perfect quartz crystals.
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Ernst K. Kov'ev, Artem P. Malakho, Sergey N. Polyakov, "Bond's method used for a double-crystal spectrometer equipped with a polycapillary halflens", Proc. SPIE 4765, International Conference on X-ray and Neutron Capillary Optics, (30 July 2002); doi: 10.1117/12.489739; https://doi.org/10.1117/12.489739
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