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16 October 2002 Stray-light analysis for multimodal miniature microscope
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Most conventional imaging systems suffer from unwanted and unexpected stray light that is often caused by reflections and scattering from optics and opto-mechanical features. This problem is easily missed during a design procedure that concentrates on improvement of imaging performance. The problem becomes apparent at the final step of production in most cases. If an imaging system consists of micro-optics, a stray light problem may become more difficult to solve due to the system's micro-scale size. The purpose of this stray light analysis is to improve imaging performance of the multi-modal miniature microscope (4M). The 4M device is a complete microscope on a chip, including optical, micro-mechanical, and electronic components. The 4M device is potentially a useful tool for early detection of pre-cancer due to its very compact size and capability for microscopic-scale imaging. Before actual fabrication of this device, however, we built the same geometry as the real 4M device in a commercial non-sequential ray tracing code and implemented stray light analysis of 4M device. Our findings indicate that most of the stray light in a 4M device is created by reflection from optics that are nominally supposed to be transparent. Due to a low signal level associated with the object, it is required to add high quality anti-reflection coatings on optics to achieve reasonable SNR.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Junwon Lee, Jeremy D. Rogers, Chen Liang, Rebecca R. Richards-Kortum, and Michael R. Descour "Stray-light analysis for multimodal miniature microscope", Proc. SPIE 4767, Current Developments in Lens Design and Optical Engineering III, (16 October 2002);

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