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25 October 2002 Calculation for effects of temperature fluctuation noise on NETD uncooled infrared thermal imaging system
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Abstract
It has been known for some time that the technology of the uncooled infrared thermal imaging system could provide a low-cost, compact-structure, low-power consumption thermal imaging device. This paper describes the theoretic limitation modal of the uncooled thermal imager's performance; temperature fluctuation noise limit is explored and presented. NETD affected by the detector structure and the noise is calculated theoretically. The theoretical curves of the relation between NETD and detector temperature, background temperature, thermal conductance and the area of the pixel are presented.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Liu and Benkang Chang "Calculation for effects of temperature fluctuation noise on NETD uncooled infrared thermal imaging system", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.451754
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