Calculation for effects of temperature fluctuation noise on NETD in uncooled infrared thermal imaging system

Lei Liu; Benkang Chang

doi:10.1117/12.451754

25 October 2002 Calculation for effects of temperature fluctuation noise on NETD uncooled infrared thermal imaging system

Lei Liu, Benkang Chang

Author Affiliations +

Proceedings Volume 4772, Electro-Optical System Design, Simulation, Testing, and Training; (2002) https://doi.org/10.1117/12.451754
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

It has been known for some time that the technology of the uncooled infrared thermal imaging system could provide a low-cost, compact-structure, low-power consumption thermal imaging device. This paper describes the theoretic limitation modal of the uncooled thermal imager's performance; temperature fluctuation noise limit is explored and presented. NETD affected by the detector structure and the noise is calculated theoretically. The theoretical curves of the relation between NETD and detector temperature, background temperature, thermal conductance and the area of the pixel are presented.

Citation Download Citation

Lei Liu and Benkang Chang "Calculation for effects of temperature fluctuation noise on NETD uncooled infrared thermal imaging system", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.451754

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