Comprehensive searchable database for contamination control plans

Diane T. Day; David W. Hughes; Nancy P. Carosso

doi:10.1117/12.481643

11 September 2002 Comprehensive searchable database for contamination control plans

Diane T. Day, David W. Hughes, Nancy P. Carosso

Proceedings Volume 4774, Optical System Contamination: Effects, Measurements, and Control VII; (2002) https://doi.org/10.1117/12.481643
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

During past years, there have been a substantial number of Contamination Control Plans (CCPs), which have been developed for a wide variety of space missions. These plans contain useful and generally applicable information for many current and future instrument and spacecraft missions. Often, the information contained within these CCPs is essentially lost after the mission and contamination control engineers are left to develop entirely new CCPs for each new spacecraft or instrument project. A new CCP database system, sponsored by NASA Goddard Space Flight Center (GSFC) and Swales Aerospace, is under development and is designed to encapsulate and categorize past Contamination Control Plans, in an extensive, methodically-searchable, database tool. Users will be able to compare and contrast various past CCPs, extract pertinent information, then apply this data to any new mission or project. This tool is not only useful as a baseline database for quicker development of new CCPs, but can also be used as a teaching tool for new contamination control engineers.

Citation Download Citation

Diane T. Day, David W. Hughes, and Nancy P. Carosso "Comprehensive searchable database for contamination control plans", Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); https://doi.org/10.1117/12.481643

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