Detection of organic contamination on surfaces by infrared spectroscopy

Jaco M. Guyt; Marc Van Eesbeek; G. Van Papendrecht

doi:10.1117/12.481659

11 September 2002 Detection of organic contamination on surfaces by infrared spectroscopy

Jaco M. Guyt, Marc Van Eesbeek, G. Van Papendrecht

Proceedings Volume 4774, Optical System Contamination: Effects, Measurements, and Control VII; (2002) https://doi.org/10.1117/12.481659
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Organic contamination control at ESA is based on the infrared spectroscopy method described in the PSS-01-705. The method is used to verify the organic contamination levels during integration and thermal vacuum tests. The detection limits are in the 10^-8 g/cm² range or below, depending on the equipment and sampling method. Quantification is performed with common space contaminants, with the possibility to include a new calibration standard when a specific contaminant is occurring more often. Sampling is done with witness sensors of 15 cm² or infrared transparent windows to verify the cleanliness after specific events. When no witness sensor has been used, solvent compatible surfaces can be analyzed by a solvent wash or by wiping the surface using dry or wetted tissues. Calibration curves with detection limits are presented, with an examples of a contamination event found on a retrieved space hardware.

Citation Download Citation

Jaco M. Guyt, Marc Van Eesbeek, and G. Van Papendrecht "Detection of organic contamination on surfaces by infrared spectroscopy", Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); https://doi.org/10.1117/12.481659

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