20 June 2002 Interferometric method to characterize thermal elongation of near-field optics probes
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Abstract
This paper presents a new method that exploits the interference and polarization properties of light to monitor, in real time, the rapid thermal elongation of near-field optical probes. The typically flat (nanometer in size) morphology of the probe apex serves as one mirror of a Fabry-Perot type cavity; a flat semitransparent metal coated surface constitutes the other mirror. The optical-interferometry set-up permits distance acquisition with a high frequency bandwidth (compared to other methods based on electronic feedback) while control of the light polarization allows an increase of the signal to noise ratio of the measurements.
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Andres H. La Rosa, Andres H. La Rosa, Bjorn Biehler, Bjorn Biehler, Arijit Sinharay, Arijit Sinharay, Hans D. Hallen, Hans D. Hallen, } "Interferometric method to characterize thermal elongation of near-field optics probes", Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); doi: 10.1117/12.472244; https://doi.org/10.1117/12.472244
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