This paper discusses progress in using spatial light modulators and interferometry to control the beam profile of an optical tweezers. The approach being developed is to use a spatial light modulator (SLM) to control the phase profile of the tweezers beam and to use a combination of the SLM and interferometry to control the intensity profile. The objective is to perform fine and calculable control of the moments and forces on a tip or tool to be used to manipulate and interrogate nanostructures. The performance of the SLM in generating multiple and independently controllable tweezers beams is also reported. Concurrent supporting research projects are mentioned and include tweezers beam scattering and neural-net processing of the interference patterns for control of the tweezers beams.