Analysis and characterization of surface defects in ophthalmic lenses

Josep Mallofre Pladellorens; Jesus Caum; Montserrat Tapias; Cristina Cadevall; Joan Anto; Xavier Fernandez

doi:10.1117/12.451806

22 October 2002 Analysis and characterization of surface defects in ophthalmic lenses

Josep Mallofre Pladellorens, Jesus Caum, Montserrat Tapias, Cristina Cadevall, Joan Anto, Xavier Fernandez

Proceedings Volume 4780, Surface Scattering and Diffraction for Advanced Metrology II; (2002) https://doi.org/10.1117/12.451806
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

A device has been designed based on the diffraction that will permit to analyze in an objective and quick form, the quality of ophthalmic lenses. This device situated in the line of production will improve the process of fabrication. The device is based on the phenomenon of the diffraction that takes place in the defects when impacting the light of the laser. The device consists of an optical system, in charge of driving the light of the laser, under good conditions, on the lens to analyze, a sensor, adapted to the wavelength of the laser, that detects the presence of the defect through the produced diffraction and a mechanism in which the lens to inspect is located assures that the laser sweeps the whole surface of the lens. A control system connected to the previous systems regulates the whole process The image obtained can be used to analyze and characterize the type of defect. Using image processing we segment the images in order to classify the defects that appear in the surface of the lens.

Citation Download Citation

Josep Mallofre Pladellorens, Jesus Caum, Montserrat Tapias, Cristina Cadevall, Joan Anto, and Xavier Fernandez "Analysis and characterization of surface defects in ophthalmic lenses", Proc. SPIE 4780, Surface Scattering and Diffraction for Advanced Metrology II, (22 October 2002); https://doi.org/10.1117/12.451806

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